תוכנה X-Rite i1Publish Pro 2

Reflectance: 0.1 ∆E94* (D50,2°, mean of 10 measurements every 3 seconds on white)

Short Term Repeatability - White

45°/0° ring illumination optics, ISO 13655:2009

Measurement Geometry

0.4 ∆E94* average, 1.0 ∆E94* max. (deviation from X-Rite manufacturing standard at a temperature of 23ºC (73.4ºF) on 12 BCRA tiles (D50, 2º))

Inter-Instrument Agreement

3.5 mm (0.14”)

Illumination Spot Size

Gas filled tungsten (illuminant type A) and UV LED

Light Source

• UV included - ISO 13655:2009 measurement condition M0

Measurement Conditions

• D50 - ISO 13655:2009 measurement condition M1

Measurement Frequency in Scanning Mode

• UV excluded Filter - ISO 13655:2009 measurement condition M2

Minimal Media Thickness

200 measurements per second

Patch Size

3 mm (0.12”) on backup board

Photometric Range

Minimal Patch Size in Scanning Mode: 7 x 10 mm (0.28” x 0.39”) (Width x Height) with sensor ruler 10 x 10 mm (0.39” x 0.39”) (Width x Height) without sensor ruler

Spectral Analyzer

10nm; Sampling interval 3.5nm

Spectral Range

i1® technology with built-in wavelengths check; Holographic diffraction grating with 128-pixel diode array

Spectral Reporting

380 - 730 nm

Supported Profile Format

380 ... 730 nm in 10 nm steps

Aperture

ICC

Unit Color

Measurement aperture: 4.5 mm (0.18”) diameter (effective measurement aperture during scanning is depending on the patch size and measurement speed)

Dimensions (length, width, height)

Silver/Black

Weight

i1Pro device: 155 mm x 66 mm x 67 mm (6.1” x 2.6” x 2.6”)

Package Dimensions (length, width, height)

i1 Ruler: 337 mm x 102 mm (13.3” x 4.0”)

Communication Interface

i1 Backup Board: 355 mm x 265 mm (14.0” x 10.4”) folded or 355 mm x 400 mm (14.0” x 15.7”) unfolded

Experience Level

i1Pro device: 245 g (8.6 oz)

Languages Supported

13.7" x 6.1" x 17.0" / 348 mm x 155 mm x 434 mm

Software Modes

USB 1.1

User Experience

Intermediate to Advanced

Calibration

Chinese (Simplified), English, French, German, Italian, Japanese, Korean, Portuguese, Spanish

Measurement Background

Basic & Advanced

Mobile Device Compatibility

Choose between a ‘basic’, wizard-driven interface or an ‘advanced’, user-driven interface for highest level professional results

Optical Brigtener Compensation (OBC)

Manual on external ceramic white reference

Scanner Target Support

white, ISO 13655:2009; for measurements on backup board

Warranty

iOS

What's Included?

Optical Brightener Compensation (OBC) with i1Profiler software

Macintosh

• ColorChecker Classic and ColorChecker Digital SG (X-Rite)

Windows

• Reflective IT 8.7/2 (X-Rite, LaserSoft and Wolf Faust)

Available Disk Space

• Transmissive 4x5 and 35mm IT 8.7/1 (X-Rite, Kodak, LaserSoft and Wolf Faust)

Connectivity

Twelve (12) months from the date of sale, unless different local regulations apply. Product registration is required to receive X-Rite technical support during the warranty period. Registration can occur directly through the software, on our website, or via phone. Users are encouraged to register their product within the first 30 days of use.

Display Resolution

i1Pro 2 spectrophotometer (measurement device), calibration plate, ambient light measurement head, monitor holder, positioning target, scanning ruler, backup board, USB cable, i1Profiler v1.x software for monitors, projectors, scanners and RGB/CMYK+ printers, ColorChecker Camera Calibration software, PANTONE Color Manager software, ColorChecker Classic target [mini], ColorChecker Proof target and soft-sided storage case. Free ColorTRUE mobile app download from iTunes® App Store.

Internet Connection

MacOS X 10.7.x, 10.8.x, 10.9.x, 10.10.x, or 10.11.x, 10.12.x (with latest upgrades installed)

Memory

Windows 7, 8, 8.1, 10 (with latest Service Pack installed)

Number of Displays Supported per Workstation

500MB (depending on components installed)

Optical Drive

Powered USB port"Powered USB port

Processor

Security

WINDOWS: Network adaptor installed and driver loaded"

Video Card

1024x768 pixels or higher

Compatible iOS Devices